Keyword 'Rectifier' Publications

AFM and Van der Pauw Measurements of Carbon Nanoparticles Prepared from Kerosene

Author(s): Tanisha Mehreen, Jahirul Islam, Mohammad Abul Hossain, Khandker Saadat Hossain

Keywords: Carbon Nanoparticles, Atomic Force Microscope, Van Der Pauw, Rectifier, Thin Film

Abstract   References Volume 8 - Jun 2019 DOI: 10.18483/ijSci.2080

Cite this Article:

Search Articles

Issue December 2022

Volume 11, December 2022


Table of Contents



World-wide Delivery is FREE

Share this Issue with Friends:

News Board

50% Discount in APC Check Article Status Publishing Period: 2 Days ijSciences is Member of Crossref ijSciences is Member of IDEAS RePEc Assigning DOI to each new article Add colorful images, drawings, tables as much as you like without any extra cost Check DOIs of your References OAI PMH

Submit your Paper


© Copyright (c) 2012 Alkhaer Publications. All rights reserved. This work is licensed under a Creative Commons Attribution 4.0 International (CC BY 4.0) License.